Celentano G., Laviano F., Pinto V., Masi A., Angelis M.D., Tomellini M., Pietropaolo A., *3Torsello D.
Mancini A., Rufoloni A., Vannozzi A., Celentano G., Braccini V., Putti M., Rizzo F., Augieri A., Armenio A.A., Martinelli A., Sotgiu G., Meledin A., Pinto V., Piperno L., Manca N., Cialone M., Iebole M.
Mancini A., Rufoloni A., Vannozzi A., Celentano G., Rizzo F., Augieri A., Armenio A.A., Pinto V., Piperno L., Masi A., Campagna E., Salvato M.
Vannozzi A., Celentano G., Rizzo F., Armenio A.A., Pinto V., Domenici F., Orlanducci S., Angelis M.D., Carcione R., Palmieri D., Politi S., Tomellini M.
Mancini A., Rufoloni A., Vannozzi A., Kursumovic A., MacManus-Driscoll J.L., Celentano G., Tendeloo G.V., Rizzo F., Augieri A., Meledin A., Pinto V., Feighan J., Mayer J.
Ключевые слова: HTS, YBCO, films epitaxial, substrate SrTiO3, nanodoping, nanoscaled effects, PLD process, pinning centers artificial, microstructure, X-ray diffraction, lattice parameter, critical temperature, critical caracteristics, Jc/B curves, growth rate, pinning force, temperature dependence, critical current density, angular dependence, fabrication, experimental results
Mancini A., Rufoloni A., Vannozzi A., Braccini V., Putti M., Manfrinetti P., Rizzo F., Augieri A., Silva E., Armenio A.A., Pinto V., Piperno L., Sylva G., Masi A., Prili S., Celentano E.S.
Ключевые слова: chalcogenide, FeSeTe, films, PLD process, fabrication, buffer layers, films epitaxial, chemical solution deposition, substrate single crystal, substrate sapphire, substrate SrTiO3, X-ray diffraction, microstructure, resistive transition, resistance, temperature dependence, critical caracteristics, Jc/B curves, pinning force
Petrisor T., Ciontea L., Mancini A., Rufoloni A., Vannozzi A., Celentano G., Rizzo F., Augieri A., Armenio A.A., Sotgiu G., Mos R.B., Pinto V., Piperno L., Petrisor JrT.
Ключевые слова: HTS, YBCO, films, template layers, substrate SrTiO3, nanoscaled effects, microstructure, critical caracteristics, critical current density, fabrication, MOD process, surface, pinning centers artificial, X-ray diffraction, Jc/B curves, angular dependence, pinning force, lattice parameter, magnetic field dependence, experimental results
Ключевые слова: HTS, YBCO, nucleation, MOD process, fluorine process, films epitaxial, substrate SrTiO3, fabrication
Mancini A., Rufoloni A., Vannozzi A., Celentano G., Augieri A., Armenio A.A., Sotgiu G., Pinto V., Piperno L., Santoni A., Rondino F., Tortora L.
Vannozzi A., Celentano G., Rizzo F., Armenio A.A., Meledin A., Pinto V., Masi A., Orlanducci S., Santoni A., Ferrarese F.M.
Ключевые слова: HTS, YBCO, films epitaxial, GdBCO, YGdBCO, fabrication, chemical solution deposition, MOD process, substrate SrTiO3, pinning centers artificial, lattice parameter, X-ray diffraction, grain size, composition, microstructure, critical caracteristics, Jc/B curves, critical temperature, irreversibility fields, temperature dependence, critical current density, angular dependence, experimental results
Mancini A., Rufoloni A., Vannozzi A., Celentano G., Augieri A., Pompeo N., Angrisani A.A., Sotgiu G., Pinto V., Piperno L., Frolova A., Santoni A., Rondino F.
Petrisor T., Ciontea L., Mancini A., Rufoloni A., Vannozzi A., Jr., Rizzo F., Augieri A., Marzi G.D., Armenio A.A., Sotgiu G., Mos R.B., Pinto V., Piperno L., Petrisor T. J., Celentano a.G.
Petrisor T., Ciontea L., Mancini A., Rufoloni A., Vannozzi A., Celentano G., Rizzo F., Augieri A., Armenio A.A., Sotgiu G., Mos R.B., Pinto V., Piperno L., jr T.P.
Petrisor T., Galluzzi V., Mancini A., Rufoloni A., Vannozzi A., Celentano G., Fabbri F., Rizzo F., Augieri A., Rubanov S., Armenio A.A., Pinto V.
Petrisor T., Ciontea L., Galluzzi V., Mancini A., Rufoloni A., Vannozzi A., Celentano G., Rizzo F., Augieri A., Armenio A.A., Sotgiu G., Mos R.B., Nasui M., Pinto V., Piperno L., Gabor M.
Petrisor T., Galluzzi V., Mancini A., Rufoloni A., Vannozzi A., Celentano G., Rizzo F., Augieri A., Armenio A.A., Sotgiu G., Pinto V., Piperno L.
Ключевые слова: HTS, coated conductors, YBCO, substrate Ni-Cu, substrate Ni-W, substrate Ni-W-Cu, buffer layers, fabrication, PLD process, chemical solution deposition, electron beam evaporation, microstructure, heat treatment, annealing process, grain boundaries, films epitaxial, X-ray diffraction, experimental results
Vannozzi A., Celentano G., Augieri A., Marzi G.D., Armenio A.A., Sotgiu G., Pinto V., Piperno L., Lamanna R.
Ключевые слова: HTS, YBCO, fabrication, MOD process, pinning centers artificial, precursors, substrate SrTiO3, spin coating process, films epitaxial, aging, composition, critical temperature
Galluzzi V., Mancini A., Rufoloni A., Vannozzi A., Celentano G., Fabbri F., Rizzo F., Augieri A., Armenio A.A., Pinto V., Piperno L., Masi A., Barba L., Arrighetti G., Campi G.
© Copyright 2006-2012. Использование материалов сайта возможно только с обязательной ссылкой на сайт.
Свои замечания и пожелания вы можете направлять по адресу perst@isssph.kiae.ru
Техническая поддержка Alexey, дизайн Teodor.